|
원자력현미경, 12인치 (Atomic Force Microscope, 12inch)
|
seongmin kang |
seongmin.kang@kanc.re.kr |
|
접촉각 측정기 (Contact angle analyzer )
|
haesoo jeong |
haesoo.jeong@kanc.re.kr |
|
고출력 고분해능 XRD
|
Kahee Kim |
kahee.kim@kanc.re.kr |
|
FE SEM IV
|
Eunjin Her |
eunjin.her@kanc.re.kr |
|
FIB I
|
Sanghee Kwak |
sanghee.kwak@kanc.re.kr |
|
XPS
|
Youngsu Choi |
youngsu.choi@kanc.re.kr |
|
4 point probe
|
Semin Kang |
semin.kang@kanc.re.kr |
|
RTA I
|
Soeun Park |
soeun.park@kanc.re.kr |
|
XRD
|
Suhyun.lee |
suhyun.lee@kanc.re.kr |
|
Non-contact sheet resistance
|
Suhyun.lee |
suhyun.lee@kanc.re.kr |
