|
FE SEM IV
|
Eunjin Her |
eunjin.her@kanc.re.kr |
|
Wafer surface particle counter
|
Youngsu Choi |
youngsu.choi@kanc.re.kr |
|
FIB I
|
Sanghee Kwak |
sanghee.kwak@kanc.re.kr |
|
Temperature and Humidity Tester
|
Wonmyoung Choi |
wonmyoung.choi@kanc.re.kr |
|
XPS
|
Youngsu Choi |
youngsu.choi@kanc.re.kr |
|
4 point probe
|
Bumdoo Park |
bumdoo.park@kanc.re.kr |
|
RTA I
|
Hyunwoong Kim |
hyunwoong.kim@kanc.re.kr |
|
XRD
|
Keunman Song |
keunman.song@kanc.re.kr |
|
Non-contact sheet resistance
|
Keunman Song |
keunman.song@kanc.re.kr |
|
PL mapper
|
Keunman Song |
keunman.song@kanc.re.kr |
